Contamination Control for Semiconductor and Microelectronics Industries
Contamination Monitoring Solutions
Particle Measuring Systems has the application expertise and industry-leading sensitivity particle monitoring instruments you need to control contamination to reduce yield loss.
We provide the global expertise and high-performance laser particle counters you count on. We continuously count particles when and where products are at risk to determine how clean your semiconductor/microelectronics processes really are.
Industry Leading Sensitivity
Point of Use Contamination Monitoring
to Protect Your Product
You need your product protected where it is and when the contamination occurs. Our solutions include:
- Continuous real-time contamination monitoring for actionable data
- Sensitivity-leading metrology solutions
- Measure contamination when and where products are at risk
- Improve throughput and quality
Direct in Every Major Market
Particle Measuring Systems has direct sales and service support in every major market, as well as a global team of Application Engineers positioned in every region with a wide range of expertise to support your needs including training and technical support.
We understand that your system is unique and that your contamination monitoring needs are specialized. Our team is there to make sure you have the support you need.
Our PMS Service Team provides you with the repeatable service, repair and reliable calibration that you need to protect your product from contamination.
Ultrapure Water UPW Contamination Control / 20 nm Particle Counting
Presented by Glen Slayter, Intel and Dan Rodier, Particle Measuring Systems at the 2020 Ultrapure Micro event. Watch this case study on the benefits of and monitoring of particles in ultrapure water (UPW) as small as 20 nm. Learn more about the Ultra DI 20 Plus particle counter.